scanning-microscope-focusing-with-landmark-feature-line-scan - Focus a scanning microscope with landmark line scans
Focuses a scanning microscope by adjusting optics to minimize the FWHM of landmark-feature line scans while correcting image drift.
Tags
Updated: 2026-09-28Capabilities
Typical Inputs
Typical Outputs
What this skill does
- Acquire ROI images
- Acquire landmark line scans
- Adjust focusing optics
- Register drifting images
- Calculate drift corrections
- Track FWHM trends
- Plot parameter-FWHM data
- Fit quadratic functions
Inputs
- ROI image file
- Line-scan positions
- Initial optics parameters
- Parameter search range
- Initial step size
- Desired parameter precision
Outputs
- Acquired 2D images
- Acquired line scans
- FWHM measurements
- Adjusted optics parameters
- Drift-corrected scan positions
- Parameter-FWHM plot
- Quadratic fit plot
- Optimization history report
Requirements
- 2D image acquisition tool
- 1D line-scan tool
- Optics parameter control tool
- Image registration tool
- Python expression evaluation tool
- NPY or TIFF file support